PATHOGEN FITNESS PENALTY AS A PREDICTOR OF DURABILITY OF DISEASE RESISTANCE GENES

Author:

Leach Jan E.1,Vera Cruz Casiana M.2,Bai Jianfa3,Leung Hei2

Affiliation:

1. Department of Plant Pathology, 4024 Throckmorton Plant Sciences Center, Kansas State University, Manhattan, Kansas

2. Division of Entomology and Plant Pathology, International Rice Research Institute, DAPO 7777, Metro Manila, The Philippines;

3. Department of Plant Pathology, 4024 Throckmorton Plant Sciences Center, Kansas State University, Manhattan, Kansas 66506-5502;

Abstract

▪ Abstract  Host plant resistance has been used extensively for disease control in many crop species; however, the resistance conferred by many sources is not durable as a result of rapid changes in the pathogen. Although many resistance genes have been identified in plant germplasm, there is no easy way to predict the quality or durability of these resistance genes. In this review, we revisit the hypothesis that resistance genes imposing a high penalty to the pathogen for adaptation will likely be durable. By elucidating the molecular changes involved in pathogen adaptation and the associated fitness cost, a proactive approach may be developed to predict the durability of resistance genes available for deployment.

Publisher

Annual Reviews

Subject

Plant Science

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3