Preparing for 6G: Developing best practices and standards for industrial measurements of low-loss dielectrics
Author:
Affiliation:
1. National Institute of Standards and Technology
2. QWED Sp. z o.o
3. Intel Corporation
4. Keysight Technologies
5. 3M Company
6. Nokia Corporation
7. Industrial Technology Research Institute
8. International Electronics Manufacturing Initiative
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10129527/10129646/10129693.pdf?arnumber=10129693
Reference6 articles.
1. Benchmarking of GHz resonator techniques for the characterisation of 5G / mmWave materials
2. Procedure providing SI-traceable results for the calibration of protein standards by sulfur determination and its application on tau
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Novel Q-Choked Resonator for Microwave Material Measurements Alleviating Sample Thickness Limitations of Existing Techniques;IEEE Microwave and Wireless Technology Letters;2024-06
2. High Frequency Assessment of Djordjevic-Sarkar Model for Low Loss Package Dielectrics;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28
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