1. Active learning of convolutional neural network for cost-effective wafer map pattern classification;jaewoong;IEEE Transactions on Semiconductor Manufacturing,2020
2. Enhanced stacked denoising autoencoder-based feature learning for recognition of wafer map defects;jianbo;IEEE Transactions on Semiconductor Manufacturing,2019
3. An image retrieval method for binary images based on DBN and softmax classifier;bin;IETE Technical Review,2015
4. Deep residual learning for image recognition;kaiming;Proc IEEE Conf Computer Vision and Pattern Recognition,2016
5. Greedy layer-wise training of deep networks;yoshua;In Advances in Neural Information Processing Systems,2007