Deep-learning path loss prediction model using side-view images
Author:
Affiliation:
1. NTT Corporation,Access Network Service Systems Laboratories,Yokosuka-shi,Kanagawa,Japan,239–0847
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Medicine
Link
http://xplorestaging.ieee.org/ielx7/10250155/10269824/10250158.pdf?arnumber=10250158
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5. Future Intelligent and Secure Vehicular Network Toward 6G: Machine-Learning Approaches
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