A sequence dependent challenge-response PUF using 28nm SRAM 6T bit cell-Reference-Cited by-同舟云学术

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A sequence dependent challenge-response PUF using 28nm SRAM 6T bit cell

Published:2017-06 Issue: Volume: Page:
ISSN:
Container-title:2017 Symposium on VLSI Circuits
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Author:

Jeloka Supreet,Yang Kaiyuan,Orshansky Michael,Sylvester Dennis,Blaauw David

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8000695/8008441/08008504.pdf?arnumber=8008504

Cited by 43 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Machine Learning Attacks on Challenge-Response Obfuscations in Strong PUFs;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06

2. Using Gate Tunneling in Bulk CMOS to Create a PUF;IEEE Internet of Things Journal;2024-01-15

3. SDR-PUF: Sequence-Dependent Reconfigurable SRAM PUF with an Exponential CRP Space;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

4. A strong physical unclonable function with machine learning immunity for Internet of Things application;Science China Information Sciences;2023-12-18

5. A 690fJ/Bit ML-Attack-Resilient Strong PUF Based on Subthreshold Voltage Attenuator Ring with Closed-Loop Feedback;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11

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