A Reliable Attenuation Characterization of EMI Absorber Material at V-band Frequencies
Author:
Affiliation:
1. IEE S.A.,Bissen,Luxembourg
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10633888/10633907/10633946.pdf?arnumber=10633946
Reference23 articles.
1. Applied Electromagnetism and Materials
2. Microwave Electronics
3. Characterization and Validation of the Slim-Form Open-Ended Coaxial Probe for the Dielectric Characterization of Biological Tissues at MillimeterWave Frequencies;Mirbeik-Sabzevari;IEEE Microwave and Wireless Components Letters,2018
4. Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK);Shu;IEEE Transactions on Instrumentation and Measurement,2024
5. Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration;Wang;IEEE Transactions on Terahertz Science and Technology,2020
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