Crack Locating in High Conductivity Plate Based on Planar Array PECT

Author:

Xiao Zhili1,Li Xiaohui1,Ma Zicheng1

Affiliation:

1. College of Electronic Information and Automation, Civil Aviation University of China,Tianjin,China,300300

Funder

National Natural Science Foundation

Fundamental Research Funds for Central Universities

Publisher

IEEE

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Simulation Study on Defect Detection of Penstocks Based on Kernel Principal Component Analysis;2024 9th International Conference on Automation, Control and Robotics Engineering (CACRE);2024-07-18

2. Reconstruction of Metal Defect Images Based on the Sensitivity Matrix of High Conductivity Initial Estimate for Eddy Current Tomography;Journal of Nondestructive Evaluation;2024-04-25

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