Semi-supervised Regression Model for Eye Diagram Estimation of High Bandwidth Memory (HBM) Silicon Interposer
Author:
Affiliation:
1. School of Electronics and Information, Hangzhou Dianzi University,MOE Key Lab of RF Circuits and Systems,Hangzhou,China,310018
Funder
National NSFC
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10249211/10249015/10249869.pdf?arnumber=10249869
Reference9 articles.
1. Semi-supervised learning by disagreement
2. Semi-Supervised Learning Based on Hybrid Neural Network for the Signal Integrity Analysis
3. High-Speed Channel Modeling With Machine Learning Methods for Signal Integrity Analysis
4. Signal Integrity Design for High-Speed Digital Circuits: Progress and Directions
5. Polynomial Model-Based Eye Diagram Estimation Methods for LFSR-Based Bit Streams in PRBS Test and Scrambling
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