EM SCA & FI Self-Awareness and Resilience with Single On-chip Loop & ML Classifiers
Author:
Affiliation:
1. School of Electrical and Computer Engineering, Purdue University,West Lafayette,IN,USA
2. Intel Corporation,Intel Labs,Hillsboro,OR,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9774496/9774497/09774588.pdf?arnumber=9774588
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4. Mitigating Power Supply Glitch based Fault Attacks with Fast All-Digital Clock Modulation Circuit
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. PG-CAS: Pro-Active EM-SCA Probe Detection Using Switched-Capacitor-Based Patterned-Ground Co-Planar Capacitive Asymmetry Sensing;IEEE Open Journal of Circuits and Systems;2023
2. Electromagnetic Analysis of Integrated On-Chip Sensing Loop for Side-Channel and Fault-Injection Attack Detection;IEEE Microwave and Wireless Components Letters;2022-06
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