Intelligent Methods for Test and Reliability-Reference-Cited by-同舟云学术

Intelligent Methods for Test and Reliability

Published:2022-03-14 Issue: Volume: Page:
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Container-title:2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Author:

Amrouch H.¹,Anders J.¹,Becker S.¹,Betka M.¹,Bleher G.²,Domanski P.¹,Elhamawy N.¹,Ertl T.¹,Gatzastras A.¹,Genssler P.¹,Hasler S.¹,Heinrich M.²,van Hoorn A.¹,Jafarzadeh H.¹,Kallfass I.¹,Klemme F.¹,Koch S.¹,Kusters R.¹,Lalama A.¹,Latty R.²,Liao Y.¹,Lylina N.¹,Haghi Z. Najafi¹,Pfluger D.¹,Polian I.¹,Rivoir J.²,Sauer M.²,Schwachhofer D.¹,Templin S.²,Volmer C.²,Wagner S.¹,Weiskopf D.¹,Wunderlich H.-J.¹,Yang B.¹,Zimmermann M.²

Affiliation:

1. University of Stuttgart,Stuttgart,Germany

2. Advantest Corporation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9774496/9774497/09774526.pdf?arnumber=9774526

Reference29 articles.

1. The plane with parallel coordinates;inselberg;The Visual Computer,1985

2. Visual neural decomposition to explain multivariate data sets;knittel;ArXiv Preprint,2020

3. Brain-inspired computing for wafer map defect pattern classification;genssler;IEEE Int'l Test Conf (ITC'21),0

4. Extreme mutation testing in practice: An industrial case study;betka;2021 IEEE/ACM International Conference on Automation of Software Test (AST),0

5. Protocols for secure computations

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