Deep Residual Neural Network for EMI Event Classification Using Bispectrum Representations
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8537458/8552938/08553177.pdf?arnumber=8553177
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Recognition of Lower Limb Movements Using Machine Learning Methods and Bispectral Maps of Wireless sEMG Measurements;IEEE Sensors Letters;2023-09
2. Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?;2022 IEEE International Conference on Internet of Things and Intelligence Systems (IoTaIS);2022-11-24
3. Review of Medium-Voltage Switchgear Fault Detection in a Condition-Based Monitoring System by Using Deep Learning;Energies;2022-09-15
4. Target Electromagnetic Detection Method in Underground Environment: A Review;IEEE Sensors Journal;2022-07-15
5. A novel fault diagnostic system for rolling element bearings using deep transfer learning on bispectrum contour maps;Engineering Science and Technology, an International Journal;2022-07
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