Photon Count Technique as a Potential Tool for Insulation Micro-Defect Detection: Principles and Primary Results
Author:
Affiliation:
1. Tsinghua University,Department of Electrical Engineering,Beijing,China,100084
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/9732629/10379183/10352432.pdf?arnumber=10352432
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4. Numerical and Experimental Investigations on Influence of Internal Defect Parameters on Partial Discharge Induced UHF Signals in Gas Insulated Switchgear
5. Effect of Profiled Surface on Streamer Propagation and the Corner Effect
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3. Simulation and Characterization of Micro-Discharge Phenomena Induced by Glitch Micro-Defects on an Insulated Pull Rod Surface;Energies;2024-05-28
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