Quantum Transport Study of Contact Resistance of Edge- and Top-Contacted Two-Dimensional Materials
Author:
Affiliation:
1. The University of Texas at Dallas,Dept. of Materials Science and Engineering,Dallas,USA
2. Taiwan Semiconductor Manufacturing Compamy Ltd.,Corporate Research,Hsinchu,Taiwan
3. Imec,Dallas, Leuven,Belgium
Funder
Taiwan Semiconductor Manufacturing Company
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10319472/10319477/10319537.pdf?arnumber=10319537
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1. DOLFIN
2. DOLFIN: a C++/Python finite element library
3. Phase transition, effective mass and carrier mobility of MoS2 monolayer under tensile strain
4. Dielectric properties of hexagonal boron nitride and transition metal dichalcogenides: from monolayer to bulk
5. The quantum transmitting boundary method
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