Double EBG Waveguides for a Contactless Estimation of the Surface Impedance
Author:
Affiliation:
1. Università di Pisa,Dipartimento di Ingegneria Dell’Informazione,Pisa,Italia
Funder
Ministry of Education
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9813726/9814163/09814343.pdf?arnumber=9814343
Reference12 articles.
1. Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films
2. Microwave Non-Destructive Testing and Evaluation
3. An Accurate Method for Measuring the Sheet Impedance of Thin Conductive Films at Microwave and Millimeter-Wave Frequencies
4. Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method
5. A contactless measurement of the surface impedance of a thin sheet of material
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