Author:
Medeiros Guilherme Cardoso,Cem Gursoy Cemil,Wu Lizhou,Fieback Moritz,Jenihhin Maksim,Taouil Mottaqiallah,Hamdioui Said
Cited by
3 articles.
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1. Transparent Memory Tests Based on the Double Address Sequences;Entropy;2021-07-14
2. Improving the Detection of Undefined State Faults in FinFET SRAMs;2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS);2021-06-28
3. Hard-to-Detect Fault Analysis in FinFET SRAMs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-06