Study of Measurement Index on the Polymer-to-Metal Direct-adhesion for Package Carrier
Author:
Affiliation:
1. Siliconware Precision Industries Co., Ltd.,Department of Package Design,Taichung,Taiwan (R.O.C.)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9795348/9795361/09795493.pdf?arnumber=9795493
Reference7 articles.
1. A new method to characterizing surface roughness of TiO2 thin films
2. Roughness Measurement Performance Obtained with Optical Interferometry and Stylus Method
3. Confocal Laser Scanning Microscopy (CLSM), a tool for counterfeit detection;yi;ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis,2018
4. Roughness of enamel surfaces after different bonding and debonding procedures
5. Waveguide Roughness Measuring Metrology with Confocal Laser Scanning Microscope (CLSM)
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