Algorithm for Small Defect Detection from Challenging Airport Runway Images Based on Bidirectional Feature Pyramid-Reference-Cited by-同舟云学术

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Algorithm for Small Defect Detection from Challenging Airport Runway Images Based on Bidirectional Feature Pyramid

Published:2023-07-24 Issue: Volume: Page:
ISSN:
Container-title:2023 42nd Chinese Control Conference (CCC)
language:
Short-container-title:

Author:

Jia Shuting¹,Li Haifeng¹,Zong Jianping²,Wang Hongpeng²,Cao Tie³,Shao Liming³

Affiliation:

1. College of Computer Science and Technology, Civil Aviation University of China,Tianjin,P. R. China,300300

2. College of Artificial Intelligence, NanKai University,Tianjin,P. R. China,300300

3. The second research institute of CAAC,Chengdu,Sichuan,P. R. China,610000

Funder

National Key Research and Development Project of China

National Natural Science Foundation

Tianjin Municipal Education Commission

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10239690/10239711/10240213.pdf?arnumber=10240213

Reference25 articles.

1. Combining deep features for object detection at various scales: finding small birds in landscape images

2. Microsoft coco: Common objects in context;lin;European Conference on Computer Vision,0

3. Improving Small Object Proposals for Company Logo Detection

4. R-cnn for small object detection;chen;Asian Conference on Computer Vision,0

5. Ssd: Single shot multibox detector;liu;European Conference on Computer Vision,0

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