Observation of Readout Temperature Dependence and Its Variability for the MEMS and ASIC System Specimens and Their PCB Testbenches

Author:

Jankowski Mariusz1,Nazdrowicz Jacek1,Zajac Piotr1,Amrozik Piotr1,Szermer Michal1,Maj Cezary1,Jablonski Grzegorz1

Affiliation:

1. Lodz University of Technology,Department of Microelectronics and Computer Science,Lodz,Poland

Publisher

IEEE

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Statistical Analysis of the Functioning of the Inertial Acceleration Sensor in a Variable Temperature Environment;2024 31st International Conference on Mixed Design of Integrated Circuits and System (MIXDES);2024-06-27

2. Influence of temperature on the quality of operation of an analog reading system for MEMS structures;2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm);2023-05-30

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