Width Confinement in 3D Dielectric Waveguides and Comparison to 2D Analytical Models
Author:
Affiliation:
1. University of Idaho,Department of Electrical and Computer Engineering,Moscow,ID 83844–1023
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10042977/10042984/10043137.pdf?arnumber=10043137
Reference9 articles.
1. S-Parameter Extraction Methodology in FDTD for Nano-Scale Optical Interconnects
2. Analytical Models of Stochastic Scattering Loss for TM and TE Modes in Dielectric Waveguides Exhibiting Exponential Surface Roughness, and a Validation Methodology in 3D FDTD;guiana,2022
3. SHF: SMALL: A novel algorithm for automated synthesis of passive, causal, and stable models for optical interconnects;zadehgol;National Science Foundation (NSF) Award #1816542,0
4. A theoretical analysis of scattering loss from planar optical waveguides
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