Rapid Pre-Characterization of Fine-Grained EM Side-Channel (In)Vulnerability of AES Modules
Author:
Affiliation:
1. The University of Texas at Austin,Austin,TX 78751,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9886002/9887372/09887440.pdf?arnumber=9887440
Reference8 articles.
1. Strengths and limitations of high-resolution electromagnetic field measurements for side-channel analysis;heyszl;Int Conf Smart Card Res Adv Appl,2012
2. Electromagnetic Radiations of FPGAs
3. SCNIFFER: Low-Cost, Automated, Efficient Electromagnetic Side-Channel Sniffing
4. A Systematic Evaluation of EM and Power Side-Channel Analysis Attacks on AES Implementations
5. 197: Advanced encryption standard (aes);Federal Information Processing Standards Publication,2001
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