Distributed Protection for High-Speed Wireline Receivers
Author:
Affiliation:
1. University of Illinois Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA,61801
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10287717/10287664/10287739.pdf?arnumber=10287739
Reference15 articles.
1. Reliability aspects of gate oxide under ESD pulse stress
2. ESD protection for high-speed receiver circuits
3. Physics-based compact model of N-Well ESD diodes;huang;Proc 45th EOS/ESD Symp,2023
4. Progress in RF inductors on silicon-understanding substrate losses
5. Analysis of the Bridged T-Coil Circuit Using the Extra-Element Theorem
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1. On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
2. A Monolithic Differential Bridged T-Coil;IEEE Microwave and Wireless Technology Letters;2024
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