Free-Space One-/Two-Port Calibration Using Planar Offset Short for Material Parameter Measurement
Author:
Affiliation:
1. Korea Research Institute of Standards and Science (KRISS),Safety Measurement Institute,Daejeon,Republic of Korea,34113
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9954936/9954602/09955011.pdf?arnumber=9955011
Reference8 articles.
1. Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
2. One-port Calibration of Free-space Material Measurement System Using Planar Offset Short
3. Improved Free-Space S-Parameter Calibration
4. Free space characterization of materials;blackham;1993 Antenna Measurement Techniques Association Symposium (AMTA 1993),1993
5. Two-port network analyzer calibration using an unknown 'thru'
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