Automated and Agile Design of Layout Hotspot Detector via Neural Architecture Search
Author:
Affiliation:
1. School of Microelectronics, Fudan University,State Key Lab of ASIC & System,Shanghai,China
2. School of Computer Science, Fudan University,China and Shanghai Key Laboratory of Data Science,Shanghai,China
Funder
National Key R&D Program of China
National Natural Science Foundation of China (NSFC)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10136870/10136706/10137142.pdf?arnumber=10137142
Reference19 articles.
1. Machine Learning in VLSI Computer-Aided Design
2. Fast dual graph-based hotspot detection;Andrew,2006
3. Iris Hui-Ru Jiang, and Charles Chiang;Yu
4. Predicting variability in nanoscale lithography processes
5. Layout Hotspot Detection With Feature Tensor Generation and Deep Biased Learning
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