BAFFI: a bit-accurate fault injector for improved dependability assessment of FPGA prototypes
Author:
Affiliation:
1. Universitat Politècnica de València,DISCA,Spain,46022
2. Universitat Politècnica de València,ITACA,Spain,46022
Funder
ECSEL Joint Undertaking (JU)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10136870/10136706/10137300.pdf?arnumber=10137300
Reference25 articles.
1. Extract LUT Logics from a Downloaded Bitstream Data in FPGA
2. Bitstream Fault Injections (BiFI)–Automated Fault Attacks Against SRAM-Based FPGAs
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1. A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03
2. Guided Fault Injection Strategy for Rapid Critical Bit Detection in Radiation-Prone SRAM-FPGA;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
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