Use of Synchrotron Reflectance Infrared Spectromicroscopy as a Rapid, Direct, Nondestructive Method for the Study of Inks on Paper-Reference-Cited by-同舟云学术

Use of Synchrotron Reflectance Infrared Spectromicroscopy as a Rapid, Direct, Nondestructive Method for the Study of Inks on Paper

Published:2002-06 Issue:6 Volume:56 Page:800-803
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Wilkinson T. J.¹,Perry D. L.¹,Martin M. C.¹,McKinney W. R.¹,Cantu A. A.¹

Affiliation:

1. Lawrence Berkeley National Laboratory, Berkeley, California 94720 (T.J.W., D.L.P., M.C.M., W.R.M.); and U.S. Secret Service, U.S. Department of the Treasury, Washington, D.C. 20373 (A.A.C.)

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/000370202760076875

Reference15 articles.

1. Analyses of inks and papers in historical documents through external beam PIXE techniques

2. FT-IR Photothermal Beam Deflection Spectroscopy of Black Inks on Paper

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