Observation of a Penetration Depth Gradient in Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging Applications-Reference-Cited by-同舟云学术

Observation of a Penetration Depth Gradient in Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging Applications

Published:2006-12 Issue:12 Volume:60 Page:1488-1492
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Wessel Elke¹,Heinsohn Guido¹,Schmidt-Lewer-Kuehne Hartmut¹,Wittern Klaus-Peter¹,Rapp Claudius¹,Siesler Heinz W.¹

Affiliation:

1. Beiersdorf AG, Research and Development, Unnastraße 48, D-20253 Hamburg, Germany (E.W., G.H., H.S.-L., K.-P.W., C.R.); and Department of Physical Chemistry, University of Duisburg-Essen, Campus Essen, Schuetzenbahn 70, D-45117 Essen, Germany (H.W.S.)

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/000370206779321391

Reference50 articles.

1. New Opportunities in Micro- and Macro-Attenuated Total Reflection Infrared Spectroscopic Imaging: Spatial Resolution and Sampling Versatility

2. Fourier Transform Spectroscopic Imaging Using an Infrared Focal-Plane Array Detector

3. Characterizing the Performance of a Fast FT-IR Imaging Spectrometer

4. Effect of Focal Plane Array Cold Shield Aperture Size on Fourier Transform Infrared Micro-Imaging Spectrometer Performance

5. Theory and Application of Gain Ranging to Fourier Transform Infrared Spectroscopic Imaging

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