Read-Noise Characterization of Focal Plane Array Detectors via Mean-Variance Analysis-Reference-Cited by-同舟云学术

Read-Noise Characterization of Focal Plane Array Detectors via Mean-Variance Analysis

Published:2005-11 Issue:11 Volume:59 Page:1315-1323
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Sperline R. P.¹,Knight A. K.¹,Gresham C. A.¹,Koppenaal D. W.¹,Hieftje G. M.¹,Denton M. B.¹

Affiliation:

1. Department of Chemistry, University of Arizona, Tucson, Arizona 86721 (R.P.S., A.K.K., M.B.D.); Sandia National Laboratories, Albuquerque, New Mexico 87185 (C.A.G.); Pacific Northwest National Laboratories, Richland, Washington 99352 (D.W.K.); and Department of Chemistry, Indiana University, Bloomington, Indiana 47405 (G.M.H.)

Abstract

Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/000370205774783250

Reference20 articles.

1. Peer Reviewed: Charge-Transfer Devices in Analytical Instrumentation

2. Developments in detectors in atomic spectroscopy

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