Wavelength Modulation for Background Correction in Graphite Furnace Atomic Emission Spectrometry-Reference-Cited by-同舟云学术

Wavelength Modulation for Background Correction in Graphite Furnace Atomic Emission Spectrometry

Published:1976-05 Issue:3 Volume:30 Page:324-329
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Epstein M. S.¹,Rains T. C.¹,O'Haver T. C.¹

Affiliation:

1. Institute for Materials Research, Analytical Chemistry Division, National Bureau of Standards, Washington, D. C. 20234 (M.S.E., T.C.R.) and Department of Chemistry, University of Maryland, College Park, Maryland 20742 (T.C.O.)

Abstract

The use of wavelength modulation for background correction in graphite furnace atomic emission spectrometry is shown to improve detection limits in some cases by several orders of magnitude and to increase its applicability to sample analysis. An HGA-2100 graphite furnace atomizer is used in conjunction with a 3/4-m monochromator equipped for wavelength modulation. A discussion of analytical growth curves, detection limits, scatter, and optimization of signal/noise ratio is presented. Copper is analyzed in botanical samples and the results are compared to analysis by atomic absorption and molecular absorption spectrophotometry.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/000370276774457263

Reference21 articles.

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3. Determination of Lithium in Copper by Carbon Furnace Atomic Emission Spectrometry

4. Flame emission spectrometry with repetitive optical scanning in the derivative mode

5. Repetitive Wavelength Scanning in Qualitative and Quantitative Flame Emission Spectroscopy

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