Counting Strategy in X-Ray Emission Spectroscopy-Reference-Cited by-同舟云学术

Counting Strategy in X-Ray Emission Spectroscopy

Published:1969-11 Issue:6 Volume:23 Page:583-586
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Plummer L. N.¹

Affiliation:

1. Department of Geology, University of Kentucky, Lexington, Kentucky 40506

Abstract

Equations are presented for obtaining greatest precision from available counting time, and minimum counting time for a specified precision in quantitative x-ray spectroscopic analyses. The equations are derived for analytical situations involving determination of the net peak intensity of a line above background and the ratio of the net peak intensities of two lines above one and two backgrounds. Graphical solutions are provided for some of the equations.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/000370269774380293

Reference9 articles.

1. Statistical factors in X-ray intensity measurements

2. MINIMIZATION OF THE VARIANCE OF PARAMETERS DERIVED FROM X‐RAY POWDER DIFFRACTOMETER LINE PROFILES

3. Statistical variance of line-profile parameters. Measures of intensity location and dispersion

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Statistical control and optimization of X-ray intensity measurements;Journal of Physics D: Applied Physics;1977-04-21

2. Recent Developments in X-Ray Spectrometry;C R C Critical Reviews in Analytical Chemistry;1974-01

3. Energy-Dispersive X-Ray Emission Spectroscopy;Applied Spectroscopy;1970-11