Direct Analysis of Solid Powder Samples with Electrically Vaporized Thin-Film Sampling and ICP Detection-Reference-Cited by-同舟云学术

Direct Analysis of Solid Powder Samples with Electrically Vaporized Thin-Film Sampling and ICP Detection

Published:1990-03 Issue:3 Volume:44 Page:367-373
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Trivedi Ketan M.¹,Brewer Stephen W.¹,Sacks Richard D.¹

Affiliation:

1. Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109 (K.M. T., R.D.S.); and Department of Chemistry, Eastern Michigan University, Ypsilanti, Michigan 48197 (S. W.B.)

Abstract

Solid powder samples deposited on Ag thin films are electrically vaporized by capacitive discharge. The aerosol produced by this method is introduced into the ICP. A low-volume vaporization chamber has been designed for these experiments. A magnetic field of a few kG normal to the electric field in the thin-film plasma is used to improve the plasma/sample interaction. A continuous flow of Ar or 60%/40% Ar/O2 through the chamber carries the aerosol from the capacitive discharge plasma into the ICP. Analytical data will be presented for a number of NIST reference materials emphasizing the determination of Mn, V, and Ni in biological and refractory inorganic matrices.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702904086137

Reference19 articles.

1. Emission spectrometry of solutions and powders with a high-frequency plasma source

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