A Simple Device for Studying FT-IR Emission Spectra of Solid Surfaces-Reference-Cited by-同舟云学术

A Simple Device for Studying FT-IR Emission Spectra of Solid Surfaces

Published:1991-02 Issue:2 Volume:45 Page:297-301
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Rewick Robert T.¹,Messerschmidt Robert G.¹

Affiliation:

1. SRI International, 333 Ravenswood Avenue, Menlo Park, California 94025 (R.T.R.); and Connecticut Instrument Corporation, 270 Main Avenue, Norwalk, Connecticut 06851 (R.G.M.)

Abstract

We have designed and tested a spectral infrared emissivity device (SIRED) for studying the FT-IR emission spectra of solid surfaces. The cell, which is commercially available, can be used from near room temperature to 400°C. Emissivity results obtained by SIRED for several common laboratory samples compare well to published values for similar materials. As an example of another measurement using SIRED, we show results for the evaluation of the plasma wavelength of a semiconductor.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702914337687

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