Excitation Temperature in High-Power Nitrogen Microwave-Induced Plasma at Atmospheric Pressure-Reference-Cited by-同舟云学术

Excitation Temperature in High-Power Nitrogen Microwave-Induced Plasma at Atmospheric Pressure

Published:1997-10 Issue:10 Volume:51 Page:1496-1499
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Ogura Kenichi¹,Yamada Hirofumi¹,Sato Yoshitaka¹,Okamoto Yukio¹

Affiliation:

1. Department of Electrical and Electronic Engineering, Faculty of Engineering (K. O., H. Y., Y. S., Y. O.), and Bio-Nano Electronics Research Center (Y. O.), Toyo University, Kawagoe, Saitama 350, Japan

Abstract

Excitation temperature, rotational temperature, and electron density were obtained for a high-power (1-kW) microwave-induced nitrogen plasma (N2 MIP) at atmospheric pressure generated by an Okamoto cavity. With 1 kW input microwave power, an excitation temperature of 5500 K, a rotational temperature of 5000 K, and an electron density in the 1013 range were measured. Excitation and rotational temperatures were much closer than is the case with the commonly used argon inductively coupled plasma, suggesting that this N2 MIP is closer to local thermodynamic equilibrium (thermal).

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702971938984

Reference23 articles.

1. Use of the microwave-induced nitrogen discharge at atmospheric pressure as an ion source for elemental mass spectrometry

2. A Moderate-Power Nitrogen Microwave-Induced Plasma as an Alternative Ion Source for Mass Spectrometry

3. Annular-shaped microwave-induced nitrogen plasma at atmospheric pressure for emission spectrometry of solutions.

4. High-sensitivity microwave-induced plasma mass spectrometry for trace element analysis

5. Elemental mass spectrometry using a nitrogen microwave-induced plasma as an ion source

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