Theoretical Development for Depth Profiling of Stratified Layers Using Variable-Angle ATR-Reference-Cited by-同舟云学术

Theoretical Development for Depth Profiling of Stratified Layers Using Variable-Angle ATR

Published:1993-08 Issue:8 Volume:47 Page:1237-1244
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Shick Robert A.¹,Koenig Jack L.¹,Ishida Hatsuo¹

Affiliation:

1. Department of Macromolecular Science, Case Western Reserve University, Cleveland, Ohio 44106

Abstract

The theory allowing depth profile information to be recovered from variable-angle attenuated total reflection spectroscopy is shown for both perpendicular and parallel polarizations. The errors invoked by the necessary approximations are evaluated by comparison with exact optical simulations using dispersion theory.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702934067856

Reference11 articles.

1. Electric Field Strengths at Totally Reflecting Interfaces

2. Frequency dependence of the penetration depth in attenuated total reflection-IR spectroscopy.

3. Matrix formalism for calculation of electric field intensity of light in stratified multilayered films

4. Electric Fields Produced by the Propagation of Plane Coherent Electromagnetic Radiation in a Stratified Medium

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