2-D Light Diffraction from CCD and Intensified Reticon Multichannel Detectors Causes Spectrometer Stray Light Problems

Author:

Bormett Richard W.1,Asher Sanford A.1

Affiliation:

1. Department of Chemistry, University of Pittsburgh, Pittsburgh, Pennsylvania 15260

Abstract

Intensified diode arrays and charge-coupled detectors (CCD) which are used as multichannel detectors for spectroscopy exhibit strong 2-D diffraction of light due to the micro-channel plate intensifier and the CCD surface microelectronic structures. The strong 2-D diffraction of light by the intensified diode arrays shows hexagonal symmetry due to the hexagonal packing of the hollow glass fibers of the micro-channel plate intensifier. The 2-D diffraction of light from the CCD detectors shows square symmetry due to the almost square symmetry of the individual surface microelectronic structures. Light incident on the detector surfaces is diffracted into numerous angles which depend upon the incident angle and the light wavelength. This diffracted light can be redispersed and/ or reflected and scattered by optical elements inside the spectrometer. This diffracted light can then contribute to spectrometer diffuse stray light or it can be directly reimaged onto the detector to cause spectral artifacts. Backthinned CCD detectors do not show 2-D light diffraction and thus avoid these 2-D diffraction stray light limitations.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Steady-State and Transient Ultraviolet Resonance Raman Spectrometer for the 193–270 nm Spectral Region;Applied Spectroscopy;2005-12

2. Direct generation of ion beam images with a two-dimensional charge injection device;Journal of the American Society for Mass Spectrometry;1995-02-01

3. Stray light performance of UV multichannel spectral measuring instruments;Spectrophotometry, Luminescence and Colour; Science & Compliance, Papers presented at the second joint meeting of the UV Spectrometry Group of the UK and the Council for Optical Radiation Measurements of the USA,;1995

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