Heuristic and Statistical Algorithms for Automated Emission Spectral Background Intensity Estimation
Author:
Affiliation:
1. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (M.L.S.); Macbeth Process Measurements, Little Britain, Newburgh, New York 12550 (J.B.C.); and The Perkin-Elmer Corporation, Norwalk, Connecticut 06859-0219 (D.A.Y.)
Abstract
Publisher
SAGE Publications
Subject
Spectroscopy,Instrumentation
Link
http://journals.sagepub.com/doi/pdf/10.1366/0003702944029749
Reference18 articles.
1. Application of a Wave-Length Modulation Device to Problems concerning Spectrometer Misalignment
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