Polarization-Modulation FT-IR Reflection Spectroscopy Using a Polarizing Michelson Interferometer-Reference-Cited by-同舟云学术

Polarization-Modulation FT-IR Reflection Spectroscopy Using a Polarizing Michelson Interferometer

Published:1987-11 Issue:8 Volume:41 Page:1288-1294
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Ishida Hatsuo¹,Ishino Yuichi¹,Buijs Henry¹,Tripp Carl¹,Dignam Michael J.¹

Affiliation:

1. Department of Macromolecular Science, Case Western Reserve University, Cleveland, Ohio 44106, U.S.A. (H.I., Y.I.); Bomem Inc., 625 rue Marais, Vanier, Quebec G1M 2Y2, Canada (H.B., C.T.); and Department of Chemistry, University of Toronto, Toronto M5S 1A1 (M.J.D.)

Abstract

We report the first results obtained on a mid-IR FT spectrometer equipped with a polarizing Michelson interferometer (PMI), and the application examples of polarization spectroscopy are illustrated. A relatively simple method for conversion of a conventional instrument to PMI operation is designed. Specular reflection spectra of poly(vinyl acetate) film on copper and ATR spectra of a Langmuir-Blodgett film on silicon prism are presented.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702874447167

Reference29 articles.

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