Affiliation:
1. Department of Chemistry, Syracuse University, Syracuse, New York 13210
Abstract
We report FT-IR-VCD recorded under improved conditions of signal-to-noise ratio, resolution, and spectral range (to 800 cm−1). Detailed descriptions are provided in the areas of artifact suppression, phase correction procedures, and comparison of FT-IR to dispersive VCD measurements. Spectral evidence supports the proposition that VCD absorbance artifacts are a surface effect originating at the optical window-solution interface.
Subject
Spectroscopy,Instrumentation
Cited by
52 articles.
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