Advantages of Dual-Beam Interferometry in Fourier Transform Infrared Spectrometry-Reference-Cited by-同舟云学术

Advantages of Dual-Beam Interferometry in Fourier Transform Infrared Spectrometry

Published:1986-07 Issue:5 Volume:40 Page:628-632
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Beduhn Donald L.¹,White Robert L.¹

Affiliation:

1. Mattson Instruments, Inc., 6333 Odana Road, Madison, Wisconsin 53719 (D.L.B.); Chemistry Department, University of Oklahoma, Norman, Oklahoma 73019 (R.L.W.)

Abstract

A dual-beam Fourier transform infrared spectrometer (FT-IR) is described. Sensitivity improvement, photometric accuracy, and instrument stability are evaluated by comparing dual-beam spectra with conventional single-beam spectra. Dual-beam FT-IR data acquisitions require an order of magnitude less measurement time than single-beam acquisitions for spectra of comparable signal-to-noise ratios. Application of dual-beam FT-IR for analysis of a highly transmitting sample is discussed. Single fiber analysis without masking and without an infrared microscope is described.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702864508520

Reference18 articles.

1. Spectromètre interférentiel multiplex pour mesures infra-rouges sur les étoiles

2. A dual-beam infrared interferometer-spectrometer

3. A High-Resolution, Far Infrared Double-Beam Lamellar Grating Interferometer

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