Application of Total Reflection X-ray Fluorescence Spectrometry to Small Glass Fragments-Reference-Cited by-同舟云学术

Application of Total Reflection X-ray Fluorescence Spectrometry to Small Glass Fragments

Published:2006 Issue:10 Volume:22 Page:1297-1300
ISSN:0910-6340
Container-title:Analytical Sciences
language:en
Short-container-title:Anal. Sci.

Author:

NISHIWAKI Yoshinori¹,SHIMOYAMA Masahiko¹,NAKANISHI Toshio¹,NINOMIYA Toshio²,NAKAI Izumi³

Affiliation:

1. Forensic Science Laboratory, Hyogo Prefectural Police Headquarters

2. Japan Synchrotron Radiation Institute

3. Department of Applied Chemistry, Faculty of Science, Tokyo University of Science

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://www.jstage.jst.go.jp/article/analsci/22/10/22_10_1297/_pdf

Reference23 articles.

1. 1. US Department of Justice, Federal Bureau of Investigation, Scientific Working Group on Materials Analysis (SWGMAT), Forensic Sci. Commun., 2005, 7, 1.

2. Comparison of refractive index, energy dispersive X-ray fluorescence and inductively coupled plasma atomic emission spectrometry for forensic characterization of sheet glass fragments

3. 3. S. G. Ryland, J. Forensic Sci., 1986, 31, 1314.

4. 4. J. A. Buscaglia, Anal. Chem. Acta, 1994, 288, 17.

5. 5. C. R. Howden, R. J. Dudley, and K. W. Smalldon, J. Forensic Sci. Soc., 1978, 18, 99.

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