Collection of laser-sampled particles in solutions followed by ICP-MS for the analysis of sintered silicon nitride.
Author:
Affiliation:
1. Department of Molecular Design and Engineering,Nagoya University,Furo-cho,Chikusa-ku,Nagoya 464-8603
Publisher
Japan Society for Analytical Chemistry
Subject
Analytical Chemistry
Link
http://www.jstage.jst.go.jp/article/bunsekikagaku/49/1/49_1_11/_pdf
Reference12 articles.
1. Determination of impurities in silicon nitride by inductively coupled plasma emission spectrometry.
2. Inter-laboratory comparison of the chemical analysis of silicon nitride
3. Analysis of Silicon Nitride Powders for Al, Cr, Cu, Fe, K, Mg, Mn, Na, and Zn by Slurry-Sampling Electrothermal Atomic Absorption Spectrometry
4. Improved Slurry Sampling Electrothermal Vaporization System Using a Tungsten Coil for Inductively Coupled Plasma Atomic Emission Spectrometry
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