Effects of Sputtering on XPS Depth Profile Analysis of Zirconium-based Chemical Conversion Coatings-Reference-Cited by-同舟云学术

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Effects of Sputtering on XPS Depth Profile Analysis of Zirconium-based Chemical Conversion Coatings

Published:2020-10-05 Issue:10.11 Volume:69 Page:559-565
ISSN:0525-1931
Container-title:BUNSEKI KAGAKU
language:en
Short-container-title:Bunseki kagaku

Author:

TAGUCHI Hideyuki¹²,MIYAZAWA Yusuke¹,KEBUKAWA Yoko³,KOBAYASHI Kensei³

Affiliation:

1. Central Research Laboratories, Analytical Science R&D Center, NIHON PARKERIZING, Co., LTD.

2. Graduate School of Engineering, Division of Materials Science and Engineering, Yokohama National University

3. Fuculty of Engineering, Division of Materials Science and Chemical Engineering, Yokohama National University

Publisher

Japan Society for Analytical Chemistry

Subject

Analytical Chemistry

Link

https://www.jstage.jst.go.jp/article/bunsekikagaku/69/10.11/69_559/_pdf

Reference2 articles.

1. 4) N. Toyoda : J. Vac. Soc. Jpn., 59, 121 (2016).

2. 11) S. Tanuma, C. J. Powell, D. R. Penn : Surf. Interface Anal., 11, 57 (1988).

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