Examination of the Bi-LSTM Based 5G-OFDM Wireless Network Over Rayleigh Fading Channel Conditions
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Published:2023-05-04
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Volume:
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ISSN:1550-4654
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Container-title:Journal of Mobile Multimedia
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language:
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Short-container-title:JMM
Author:
Sarangi Sanjaya Kumar,Lenka Rasmita,Shankar Ravi,Mehraj Haider,Krishnan V. Gokula
Abstract
Fifth generation (5G) wireless networks’ system performance is dependent on having perfect knowledge of the channel state information (CSI). Deep learning (DL) has helped improve both the end-to-end reliability of 5G and beyond fifth generation (B5G) networks and the computational complexity of these networks. This work uses the Bi-linear long short-term memory (Bi-LSTM) scheme to examine the overall performance of the 5G orthogonal frequency division multiplexing (OFDM) technology. The least squares (LS) channel estimation scheme is a famous scheme employed to estimate the fading channel coefficients due to their lower complexity without the prior CSI. However, this scheme has an exceedingly high CSI error. Using pilot symbols (PS) and loss functions, this work has proposed the Bi-LSTM 5G OFDM estimators to improve the channel estimation obtained by the LS approach. All simulation analysis uses convex optimization (CO) software (CVX software) and stochastic gradient descent (SGD). When combined with many PS (72) and a cross-entropy loss function, the proposed Bi-LSTM outperforms the long-short-term memory (LSTM) cross-entropy, LS, and minimum mean square error (MMSE) estimators in low, medium, and high signal-to-noise ratio (SNR) regimes. The computational and training times of Bi-LSTM and LSTM DL estimators are also compared. Because of its DNN design, it can evaluate massive datasets, find hidden statistical patterns and characteristics, establish underlying relationships, and transfer what it has learnt to other contexts. Statistical analysis of the bit error rate (BER) reveals that Bi-LSTM outperforms the MMSE in terms of accurate channel prediction.
Publisher
River Publishers
Subject
Industrial and Manufacturing Engineering,Media Technology,Communication
Cited by
1 articles.
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