NO-STANDARDS QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS CONTAINING LIGHT ELEMENTS
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Published:1981
Issue:2
Volume:30
Page:208
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ISSN:1000-3290
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Container-title:Acta Physica Sinica
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language:
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Short-container-title:Acta Phys. Sin.
Author:
ZHANG REN-JI ,GE SEN-LIN ,WU ZI-QIN ,
Abstract
In this article, the no-standards quantitative analysis method using the ratios of the X-ray intensities of the elements in the samples has been improved. The "full diffusion" model of the electron scattering has been properly modified and simplified and a stepped depth distribution curve of the X ray has been obtained. From this distribution curve, the quantitative relationship between the constituents of samples and the intensities of the characteristic X-rays has been determined. The analysed values of the Cu-Si, FeS2 NaCl and GaAs are coincident with the actual values. Our results are better in some extent than the results of Russ's method which used the calculated X-ray intensity factors of pure elements and the routine ZAF correction. The calculation procedure of our method is also simpler than the procedure of the latter method.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
2 articles.
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