A new method for identifying TE01δ mode during microwave dielectric measurements of low-loss materials

Author:

Li Lei,Yan Han,Chen Xiang-Ming,

Abstract

The metal resonant cavity method working with TE<sub>01δ</sub> mode is a universal method for evaluating the microwave dielectric properties of low-loss materials. All the microwave dielectric resonators are multi-mode resonators, so the correct identification of TE<sub>01δ</sub> mode is the basis for the microwave dielectric measurements. The TE<sub>01δ</sub> mode can be identified by predicting the resonant frequency and its variation with resonator size, expelling the spurious modes according to the exciting conditions, etc., while these methods are relatively complex and sometimes unreliable. In the present work, a simple method for accurately identifying the TE<sub>01δ</sub> mode is developed. A low-loss reference sample with known dielectric properties is introduced and placed in the cavity for the first step, and the to-be-measured sample is placed on the reference sample for the second step. The rough permittivity of the to-be-measured sample can be calculated from the TE<sub>01δ</sub>-mode resonant frequencies in the two steps through the finite element analysis, and is used to predict the resonant frequency for TE<sub>01δ</sub> mode when only the to-be-measured sample is placed in the cavity. The difference between the predicted and measured TE<sub>01δ</sub>-mode resonant frequencies for the to-be-measured sample is less than 1%, so that the TE<sub>01δ</sub> mode can be easily distinguished from the spurious modes and accurately identified.

Publisher

Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences

Subject

General Physics and Astronomy

Reference36 articles.

1. Sebastian M T 2008 Dielectric Materials for Wireless Communication. (Oxford: Elsevier Science Publishers) pp1–48

2. Narang S B, Bahel S 2010 J. Ceram. Process. Res. 11 316

3. Sebastian M T, Ubic R, Jantunen H 2015 Int. Mater. Rev. 60 392

4. Chen L F, Ong C K, Neo C P, Varadan V V, Varadan V K 2004 Microwave Electronics: Measurement and Material Characterization (Chichester: John Wiley & Sons) pp37–141

5. Kajfez D, Guillon P 1998 Dielectric Resonators (2nd Ed.) (Atlanta: Noble) pp327–430

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3