Electron holography determination of the growth polarity of GaN/AlGaN multi-quantum well structure
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Published:2006
Issue:11
Volume:55
Page:5829
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ISSN:1000-3290
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Container-title:Acta Physica Sinica
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language:
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Short-container-title:Acta Phys. Sin.
Author:
Dai Tao ,Liu Yu-Zi ,Zhang Ze ,
Abstract
A method to determine the growth polarity of GaN/AlGaN multi-quantum wells (MQWs) has been proposed. Electron holography (EH) study of the potential profiles of the multi-quantum well structure has been used here to determine the direction of build-in electric field that is strictly related to the growth polarity.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
1 articles.
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