Author:
Zhao Dong-Cai ,Ren Ni ,Ma Zhan-Ji ,Qiu Jia-Wen ,Xiao Geng-Jie ,Wu Sheng-Hu ,
Abstract
A series of samples with different Si concentration were prepared by adjusting the numbers of Si-doped graphite targets and pure graphite targets. It was found that the stress in the thin films decreased from 4.5GPa to 3.1GPa when the Si concentration reached 6.7at.%,but the hardness kept constant at about 3600Hv,almost the same as of un-doped thin films,and the friction coefficient of thin films kept constant at about 0.15. As the Si concentration in the thin film kept on increasing,the concentration of C-Si bond will increase,leading to the decrease of hardness and stress and the increase of friction coefficient.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
8 articles.
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