Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy
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Published:2009
Issue:12
Volume:58
Page:8478
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ISSN:1000-3290
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Container-title:Acta Physica Sinica
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language:
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Short-container-title:Acta Phys. Sin.
Author:
Wang Qiao-Zhan ,Yu Run-Sheng ,Qin Xiu-Bo ,Li Yu-Xiao ,Wang Bao-Yi ,Jia Quan-Jie ,
Abstract
Mesoporous silica thin films with different pore shapes were prepared by evaporation induced self-assembly method. The synchrotron radiation x-ray reflectivity and slow positron annihilation techniques were used to characterize the pore structures. The results indicated that with increase of the spin-coating speed, the pore structure transformed from 3-D cubic to 2-D hexagonal, the average porosity also decreased. The correlation of the film structures and positron annihilation parameters was songht for with FT-IR spectroscopy and isotropic inorganic pore contraction model.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
1 articles.
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