Author:
Yang Wei ,Liang Ji-Ran ,Liu Jian ,Ji Yang , ,
Abstract
The optical properties of vanadium oxide thin film are measured at semiconductor-metal transition, including reflectance and transmittance results at different wavelengths which show different trends during the phase transition. With a multi-level reflection-transmission model of incoherent light, we calculate the values of refractive index n and extinction coefficient k at different wavelengths, and show that the abnormal optical properties result not only from the dependences of n and k on the wavelength, but also from multiple reflections in the absorbing film.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
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