THE CHARACTERISTIC X-RAY INTENSITY FACTORS OF THE PURE ELEMENT BULK SAMPLES
-
Published:1981
Issue:7
Volume:30
Page:895
-
ISSN:1000-3290
-
Container-title:Acta Physica Sinica
-
language:
-
Short-container-title:Acta Phys. Sin.
Author:
CAI WEI ,GE SEN-LIN ,WU ZI-QIN ,
Abstract
The K-series X-ray intensities of eight pure elements (from Al to Ge) and the L-series X-ray intensities of four pure elements (from Ni to Ge) excited by 15-30 keV electrons have been measured. Using the modified and simplified "full diffusion" electron diffusion model the ratios of the characteristic X-ray intensities) of these pure elements have been calculated. The back scattering effect is included in this model itself and the absorption correction factors are obtained from the stepped intensity-depth distribution derived from this model. Moreover the continuum fluorescence effect is also considered. The calculated values are in agreement with the experimental data, therefore the reliability of the model is verified.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Standardless EDS analysis of bulk and thin specimens;Journal of Electron Microscopy Technique;1987-12