Author:
Xie Guo-Feng ,Wang De-Wu ,Ying Chun-Tong ,
Abstract
The two_dimensional thin film growth is simulated by modified diffusion_Limited_ aggregation method. The thin film morphologies such as fractal growth and dense growth are obtained by changing the parameters DT,DC an d DV. The number and the size of clusters changing with coverage are analyzed. The re sults are consistent with the experimental results.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
3 articles.
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